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El Yazidi, Youness, Ellabib, Abdellatif. (1405). An heuristic method for solving an inverse problem in semiconductors governed by a nonlinear coupled system. سامانه مدیریت نشریات علمی, 14(2), 606-615. doi: 10.22034/cmde.2025.62043.2708
Youness El Yazidi; Abdellatif Ellabib. "An heuristic method for solving an inverse problem in semiconductors governed by a nonlinear coupled system". سامانه مدیریت نشریات علمی, 14, 2, 1405, 606-615. doi: 10.22034/cmde.2025.62043.2708
El Yazidi, Youness, Ellabib, Abdellatif. (1405). 'An heuristic method for solving an inverse problem in semiconductors governed by a nonlinear coupled system', سامانه مدیریت نشریات علمی, 14(2), pp. 606-615. doi: 10.22034/cmde.2025.62043.2708
El Yazidi, Youness, Ellabib, Abdellatif. An heuristic method for solving an inverse problem in semiconductors governed by a nonlinear coupled system. سامانه مدیریت نشریات علمی, 1405; 14(2): 606-615. doi: 10.22034/cmde.2025.62043.2708

An heuristic method for solving an inverse problem in semiconductors governed by a nonlinear coupled system

Computational Methods for Differential Equations
مقاله 7، دوره 14، شماره 2، تیر 2026، صفحه 606-615    اصل مقاله (542.91 K)
نوع مقاله: Research Paper
شناسه دیجیتال (DOI): 10.22034/cmde.2025.62043.2708
نویسندگان
Youness El Yazidi* 1؛ Abdellatif Ellabib2
1Research Laboratory in Numerical Analysis and Nonlinear Analysis (LaR2A) Department of Mathematics, Faculty of Sciences, University Abdelmalek Essaadi, BP 2121 M'Hannech II 93030 Tetouan, Morocco.
2Laboratory of Applied Mathematics and Computer Science, Faculty of Science and Technology, Cady Ayyad University, Marrakesh, Morocco.
چکیده
In this work, we utilize a coupled system to describe the carrier density in the Metal-Semiconductor Field-Effect Transistor (MESFET) device. To identify the depletion layer in this semiconductor, we define a cost functional $J$, and then use it to derive the shape optimization problem, for which we prove the existence of a solution. We develop an approach to solve this optimization problem using the finite element method combined with particle swarm optimization. Finally, we present several numerical examples to demonstrate the robustness of our proposed algorithm in identifying the depletion layer in the MESFET device.
کلیدواژه‌ها
Free boundary problem؛ Shape optimization؛ Finite element method؛ Particle swarm optimization
مراجع
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تعداد مشاهده مقاله: 368
تعداد دریافت فایل اصل مقاله: 387


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